Back to Table of Contents
42301-G5
Direct Observations of the Dynamic Evolution of Nanoscale Features in Ferroelectric Thin Films: An In Situ Transmission Electron Microscopy Study
Xiaoli Tan, Iowa State University
Detailed studies of the phase transitions in Pb0.99Nb0.02[(Zr0.57Sn0.43)1-yTiy]0.98O3
(abbreviated as PNZST 43/100y/2, y=0.03, 0.04, 0.05, 0.06, 0.07, 0.08,
0.10, and 0.12) ceramics as a function of composition, temperature, electric
field, and time were conducted using x-ray diffraction, dielectric measurement,
Raman spectroscopy, and transmission electron microscopy (TEM). It was found
that for ceramics PNZST 43/100y/2 with 0.03£y£0.08, antiferroelectric order is stable at room
temperature. While for y=0.10 and 0.12, a ferroelectric order was observed at
room temperature. In the antiferroelectric phase, a characteristic nanoscale
feature in the form of incommensurate modulations was directly observed by
TEM. In the ferroelectric phase, the nanoscale feature disappears. Associated
with the evolution of the nanoscale features is the ceramics' fracture
resistance. We found that antiferroelectric ceramics displays fewer
microcracks under indentation than ferroelectric ceramics with similar
compositions. For the first time, we proposed a phase transition toughening
mechanism is activated in antiferroelectric ceramics. This may lead to the development
of electroceramics with excellent electrical as well as mechanical properties.
Back to top